Topic: Introduction to Nanomechanical Measurements with Atomic Force Microscopy
Reporter: Roger Proksch
Time: 15:00-16:10, 14/12/2018(Friday) 
Place: Room 529, building 18, Ming palace campus   
Organizers:Department of international cooperation, State key laboratory of mechanics and control of mechanical structures, College of Aerospace Engineering.  

The summary of report:
Whether investigating fundamental research principles or engineering a specific product, the atomic force microscope (AFM) is a key instrument for evaluating polymers and polymer blends. Its spatial resolution enables visualization of sub-micrometer and sub-nanometer morphology and structure. However, recent advances mean that AFMs can also measure the physical properties and functional behavior of polymers at small length scales. In addition to familiar topographic imaging, AFMs can probe molecular-level forces; map mechanical, thermal, and electrical properties; and assess solvent and thermal effects in near real time. This talk provides an overview of the AFM’s powerful capabilities for polymers characterization and will cover:
1.Force-distance curves
2.Fast force mapping
3.Force modulation and nano-rheology
4.Resonant “tapping” modes – phase, loss tangent and AMFM imaging

Speaker Profile:
Roger Proksch, he is the President of AR atomic force department of Oxford instruments and the founder of Asylum Research (merged with Oxford instruments).Famous expert in atomic force microscopy.He has published more than 100 high-level academic papers, many of which are published in the world's top journals such as Nature Materials and Nature Nanotechnology.